Kelvin probe force microscopy using near-field optical tips

R. Shikler; Y. Rosenwaks

doi:10.1016/S0169-4332(99)00536-X

Kelvin probe force microscopy using near-field optical tips

R. Shikler^*
, Y. Rosenwaks

^*Corresponding author for this work

School of Electrical Engineering

Tel Aviv University

Research output: Contribution to journal › Conference article › peer-review

4 Scopus citations

Abstract

We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.

Original language	English
Pages (from-to)	256-262
Number of pages	7
Journal	Applied Surface Science
Volume	157
Issue number	4
DOIs	https://doi.org/10.1016/S0169-4332(99)00536-X
State	Published - 2 Apr 2000
Event	NC-AFM'99: 2nd International Workshop on Nancontact Atomic Force Microscopy - Pontresina, Switz Duration: 1 Sep 1999 → 4 Sep 1999

Funding

Funders	Funder number
IDB group foundation	9701
Israel Academy of Science and Humanities-Recanati
Israel Ministry of Science
Israel Science Foundation

Access to Document

10.1016/S0169-4332(99)00536-X

Cite this

@article{5bc6c8a4e1de421da260d6ac15194206,

title = "Kelvin probe force microscopy using near-field optical tips",

abstract = "We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.",

author = "R. Shikler and Y. Rosenwaks",

note = "Funding Information: This research is supported by the Israel Science foundation administered by the Israel Academy of Science and Humanities-Recanati and IDB group foundation, and by grant 9701 of the Israel Ministry of Science. R.S. is supported be Eshkol special scholarship of Israel Ministry of Science.; NC-AFM'99: 2nd International Workshop on Nancontact Atomic Force Microscopy ; Conference date: 01-09-1999 Through 04-09-1999",

year = "2000",

month = apr,

day = "2",

doi = "10.1016/S0169-4332(99)00536-X",

language = "אנגלית",

volume = "157",

pages = "256--262",

journal = "Applied Surface Science",

issn = "0169-4332",

publisher = "Elsevier BV",

number = "4",

}

TY - JOUR

T1 - Kelvin probe force microscopy using near-field optical tips

AU - Shikler, R.

AU - Rosenwaks, Y.

N1 - Funding Information: This research is supported by the Israel Science foundation administered by the Israel Academy of Science and Humanities-Recanati and IDB group foundation, and by grant 9701 of the Israel Ministry of Science. R.S. is supported be Eshkol special scholarship of Israel Ministry of Science.

PY - 2000/4/2

Y1 - 2000/4/2

N2 - We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.

AB - We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.

UR - https://www.scopus.com/pages/publications/0033749428

U2 - 10.1016/S0169-4332(99)00536-X

DO - 10.1016/S0169-4332(99)00536-X

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.conferencearticle???

AN - SCOPUS:0033749428

SN - 0169-4332

VL - 157

SP - 256

EP - 262

JO - Applied Surface Science

JF - Applied Surface Science

IS - 4

T2 - NC-AFM'99: 2nd International Workshop on Nancontact Atomic Force Microscopy

Y2 - 1 September 1999 through 4 September 1999

ER -

Kelvin probe force microscopy using near-field optical tips

Abstract

Funding

Access to Document

Other files and links

Fingerprint

Cite this