TY - JOUR
T1 - Kelvin probe force microscopy using near-field optical tips
AU - Shikler, R.
AU - Rosenwaks, Y.
N1 - Funding Information:
This research is supported by the Israel Science foundation administered by the Israel Academy of Science and Humanities-Recanati and IDB group foundation, and by grant 9701 of the Israel Ministry of Science. R.S. is supported be Eshkol special scholarship of Israel Ministry of Science.
PY - 2000/4/2
Y1 - 2000/4/2
N2 - We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.
AB - We report on the use of near-field optical force sensors for Kelvin probe force microscopy (KPFM) and surface potential measurements. It is shown that a very good potential sensitivity of less than 5 mV can be obtained using such tips. In addition, it is found that the contact potential difference measured using these tips is independent of the scanning height, as long as it is below 40 nm, and of the applied AC amplitude as long as it is in the range of 1-3 V.
UR - http://www.scopus.com/inward/record.url?scp=0033749428&partnerID=8YFLogxK
U2 - 10.1016/S0169-4332(99)00536-X
DO - 10.1016/S0169-4332(99)00536-X
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AN - SCOPUS:0033749428
SN - 0169-4332
VL - 157
SP - 256
EP - 262
JO - Applied Surface Science
JF - Applied Surface Science
IS - 4
T2 - NC-AFM'99: 2nd International Workshop on Nancontact Atomic Force Microscopy
Y2 - 1 September 1999 through 4 September 1999
ER -