IR-SNOM on a fork: Infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers

B. J. Pandey, K. P. Clark, F. Abbas, E. Fuchs, K. Lascola, Yamac Dikmelik, D. Hinojos, K. Hodges, D. I. Robbins, M. Platkov, A. Katzir, A. Suliman, G. Spingarn, A. Niguès, J. F. Veyan, Q. Gu, K. Roodenko

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

The fundamental optical diffraction in infrared microscopes limits their spatial resolution to about ∼5μm and hinders the detailed observation of heat generation and dissipation behaviors in micrometer-sized optoelectronic and semiconductor devices, thus impeding the understanding of basic material properties, electrical shorts and structural defects at a micron and sub-micron scale. We report the recent development of a scanning near-field optical microscopy (SNOM) method for thermal imaging with subwavelength spatial resolution. The system implements infrared fiber-optic probes with subwavelength apertures at the apex of a tip for coupling to thermal radiation. Topographic imaging and tip-to-sample distance control are enabled by the implementation of a macroscopic aluminum tuning fork of centimeter size to support IR thermal macro-probes. The SNOM-on-a-fork system is developed as a capability primarily for the thermal profiling of MWIR quantum cascade lasers (QCLs) during pulsed and continuous wave (CW) operation, targeting QCL design optimization. Time-resolved thermal measurements with high spatial resolution will enable better understanding of thermal effects that can have a significant impact on a laser's optical performance and reliability, and furthermore, will serve as a tool to diagnose failure mechanisms.

Original languageEnglish
Title of host publicationQuantum Sensing and Nano Electronics and Photonics XVII
EditorsManijeh Razeghi, Jay S. Lewis, Giti A. Khodaparast, Pedram Khalili
PublisherSPIE
ISBN (Electronic)9781510633391
DOIs
StatePublished - 2020
EventQuantum Sensing and Nano Electronics and Photonics XVII 2020 - San Francisco, United States
Duration: 2 Feb 20206 Feb 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11288
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceQuantum Sensing and Nano Electronics and Photonics XVII 2020
Country/TerritoryUnited States
CitySan Francisco
Period2/02/206/02/20

Keywords

  • Heat transfer
  • Infrared
  • Microscopy
  • Near-Field
  • QCL
  • SNOM
  • Thermal imaging

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