IR-SNOM on a fork: Infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers

B. J. Pandey; K. P. Clark; F. Abbas; E. Fuchs; K. Lascola; Yamac Dikmelik; D. Hinojos; K. Hodges; D. I. Robbins; M. Platkov; A. Katzir; A. Suliman; G. Spingarn; A. Niguès; J. F. Veyan; Q. Gu; K. Roodenko

doi:10.1117/12.2543849

IR-SNOM on a fork: Infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers

B. J. Pandey, K. P. Clark, F. Abbas, E. Fuchs, K. Lascola, Yamac Dikmelik, D. Hinojos, K. Hodges, D. I. Robbins, M. Platkov^*, A. Katzir, A. Suliman, G. Spingarn, A. Niguès, J. F. Veyan, Q. Gu, K. Roodenko

^*Corresponding author for this work

School of Physics and Astronomy

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Scopus citations

Abstract

The fundamental optical diffraction in infrared microscopes limits their spatial resolution to about ∼5μm and hinders the detailed observation of heat generation and dissipation behaviors in micrometer-sized optoelectronic and semiconductor devices, thus impeding the understanding of basic material properties, electrical shorts and structural defects at a micron and sub-micron scale. We report the recent development of a scanning near-field optical microscopy (SNOM) method for thermal imaging with subwavelength spatial resolution. The system implements infrared fiber-optic probes with subwavelength apertures at the apex of a tip for coupling to thermal radiation. Topographic imaging and tip-to-sample distance control are enabled by the implementation of a macroscopic aluminum tuning fork of centimeter size to support IR thermal macro-probes. The SNOM-on-a-fork system is developed as a capability primarily for the thermal profiling of MWIR quantum cascade lasers (QCLs) during pulsed and continuous wave (CW) operation, targeting QCL design optimization. Time-resolved thermal measurements with high spatial resolution will enable better understanding of thermal effects that can have a significant impact on a laser's optical performance and reliability, and furthermore, will serve as a tool to diagnose failure mechanisms.

Original language	English
Title of host publication	Quantum Sensing and Nano Electronics and Photonics XVII
Editors	Manijeh Razeghi, Jay S. Lewis, Giti A. Khodaparast, Pedram Khalili
Publisher	SPIE
ISBN (Electronic)	9781510633391
DOIs	https://doi.org/10.1117/12.2543849
State	Published - 2020
Event	Quantum Sensing and Nano Electronics and Photonics XVII 2020 - San Francisco, United States Duration: 2 Feb 2020 → 6 Feb 2020

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	11288
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Quantum Sensing and Nano Electronics and Photonics XVII 2020
Country/Territory	United States
City	San Francisco
Period	2/02/20 → 6/02/20

Funding

Funders	Funder number
Air Force STTR	FA8650-18-C-1737

Keywords

Heat transfer
Infrared
Microscopy
Near-Field
QCL
SNOM
Thermal imaging

Access to Document

10.1117/12.2543849

Cite this

Pandey, B. J., Clark, K. P., Abbas, F., Fuchs, E., Lascola, K., Dikmelik, Y., Hinojos, D., Hodges, K., Robbins, D. I., Platkov, M., Katzir, A., Suliman, A., Spingarn, G., Niguès, A., Veyan, J. F., Gu, Q., & Roodenko, K. (2020). IR-SNOM on a fork: Infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers. In M. Razeghi, J. S. Lewis, G. A. Khodaparast, & P. Khalili (Eds.), Quantum Sensing and Nano Electronics and Photonics XVII Article 112881Q (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11288). SPIE. https://doi.org/10.1117/12.2543849

Pandey, B. J. ; Clark, K. P. ; Abbas, F. et al. / IR-SNOM on a fork : Infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers. Quantum Sensing and Nano Electronics and Photonics XVII. editor / Manijeh Razeghi ; Jay S. Lewis ; Giti A. Khodaparast ; Pedram Khalili. SPIE, 2020. (Proceedings of SPIE - The International Society for Optical Engineering).

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title = "IR-SNOM on a fork: Infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers",

abstract = "The fundamental optical diffraction in infrared microscopes limits their spatial resolution to about ∼5μm and hinders the detailed observation of heat generation and dissipation behaviors in micrometer-sized optoelectronic and semiconductor devices, thus impeding the understanding of basic material properties, electrical shorts and structural defects at a micron and sub-micron scale. We report the recent development of a scanning near-field optical microscopy (SNOM) method for thermal imaging with subwavelength spatial resolution. The system implements infrared fiber-optic probes with subwavelength apertures at the apex of a tip for coupling to thermal radiation. Topographic imaging and tip-to-sample distance control are enabled by the implementation of a macroscopic aluminum tuning fork of centimeter size to support IR thermal macro-probes. The SNOM-on-a-fork system is developed as a capability primarily for the thermal profiling of MWIR quantum cascade lasers (QCLs) during pulsed and continuous wave (CW) operation, targeting QCL design optimization. Time-resolved thermal measurements with high spatial resolution will enable better understanding of thermal effects that can have a significant impact on a laser's optical performance and reliability, and furthermore, will serve as a tool to diagnose failure mechanisms.",

keywords = "Heat transfer, Infrared, Microscopy, Near-Field, QCL, SNOM, Thermal imaging",

author = "Pandey, {B. J.} and Clark, {K. P.} and F. Abbas and E. Fuchs and K. Lascola and Yamac Dikmelik and D. Hinojos and K. Hodges and Robbins, {D. I.} and M. Platkov and A. Katzir and A. Suliman and G. Spingarn and A. Nigu{\`e}s and Veyan, {J. F.} and Q. Gu and K. Roodenko",

note = "Publisher Copyright: {\textcopyright} 2020 SPIE.; Quantum Sensing and Nano Electronics and Photonics XVII 2020 ; Conference date: 02-02-2020 Through 06-02-2020",

year = "2020",

doi = "10.1117/12.2543849",

language = "אנגלית",

series = "Proceedings of SPIE - The International Society for Optical Engineering",

publisher = "SPIE",

editor = "Manijeh Razeghi and Lewis, {Jay S.} and Khodaparast, {Giti A.} and Pedram Khalili",

booktitle = "Quantum Sensing and Nano Electronics and Photonics XVII",

address = "ארצות הברית",

}

Pandey, BJ, Clark, KP, Abbas, F, Fuchs, E, Lascola, K, Dikmelik, Y, Hinojos, D, Hodges, K, Robbins, DI, Platkov, M, Katzir, A, Suliman, A, Spingarn, G, Niguès, A, Veyan, JF, Gu, Q & Roodenko, K 2020, IR-SNOM on a fork: Infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers. in M Razeghi, JS Lewis, GA Khodaparast & P Khalili (eds), Quantum Sensing and Nano Electronics and Photonics XVII., 112881Q, Proceedings of SPIE - The International Society for Optical Engineering, vol. 11288, SPIE, Quantum Sensing and Nano Electronics and Photonics XVII 2020, San Francisco, United States, 2/02/20. https://doi.org/10.1117/12.2543849

IR-SNOM on a fork: Infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers. / Pandey, B. J.; Clark, K. P.; Abbas, F. et al.
Quantum Sensing and Nano Electronics and Photonics XVII. ed. / Manijeh Razeghi; Jay S. Lewis; Giti A. Khodaparast; Pedram Khalili. SPIE, 2020. 112881Q (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11288).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Pandey, B. J.

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AU - Abbas, F.

AU - Fuchs, E.

AU - Lascola, K.

AU - Dikmelik, Yamac

AU - Hinojos, D.

AU - Hodges, K.

AU - Robbins, D. I.

AU - Platkov, M.

AU - Katzir, A.

AU - Suliman, A.

AU - Spingarn, G.

AU - Niguès, A.

AU - Veyan, J. F.

AU - Gu, Q.

AU - Roodenko, K.

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AB - The fundamental optical diffraction in infrared microscopes limits their spatial resolution to about ∼5μm and hinders the detailed observation of heat generation and dissipation behaviors in micrometer-sized optoelectronic and semiconductor devices, thus impeding the understanding of basic material properties, electrical shorts and structural defects at a micron and sub-micron scale. We report the recent development of a scanning near-field optical microscopy (SNOM) method for thermal imaging with subwavelength spatial resolution. The system implements infrared fiber-optic probes with subwavelength apertures at the apex of a tip for coupling to thermal radiation. Topographic imaging and tip-to-sample distance control are enabled by the implementation of a macroscopic aluminum tuning fork of centimeter size to support IR thermal macro-probes. The SNOM-on-a-fork system is developed as a capability primarily for the thermal profiling of MWIR quantum cascade lasers (QCLs) during pulsed and continuous wave (CW) operation, targeting QCL design optimization. Time-resolved thermal measurements with high spatial resolution will enable better understanding of thermal effects that can have a significant impact on a laser's optical performance and reliability, and furthermore, will serve as a tool to diagnose failure mechanisms.

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KW - Infrared

KW - Microscopy

KW - Near-Field

KW - QCL

KW - SNOM

KW - Thermal imaging

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Pandey BJ, Clark KP, Abbas F, Fuchs E, Lascola K, Dikmelik Y et al. IR-SNOM on a fork: Infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers. In Razeghi M, Lewis JS, Khodaparast GA, Khalili P, editors, Quantum Sensing and Nano Electronics and Photonics XVII. SPIE. 2020. 112881Q. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2543849

IR-SNOM on a fork: Infrared scanning near-field optical microscopy for thermal profiling of quantum cascade lasers

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