TY - JOUR
T1 - Ion current rectification in funnel-shaped nanochannels
T2 - Hysteresis and inversion effects
AU - Rosentsvit, Leon
AU - Wang, Wei
AU - Schiffbauer, Jarrod
AU - Chang, Hsueh Chia
AU - Yossifon, Gilad
N1 - Publisher Copyright:
© 2015 AIP Publishing LLC.
PY - 2015/12/14
Y1 - 2015/12/14
N2 - Ion current rectification inversion is observed in a funnel-shaped nanochannel above a threshold voltage roughly corresponding to the under-limiting to over-limiting current transition. Previous experimental studies have examined rectification at either low-voltages (under-limiting current region) for conical nanopores/funnel-shaped nanochannels or at high-voltages (over-limiting region) for straight nanochannels with asymmetric entrances or asymmetric interfacing microchannels. The observed rectification inversion occurs because the system resistance is shifted, beyond a threshold voltage, from being controlled by intra-channel ion concentration-polarization to that controlled by external concentration-polarization. Additionally, strong hysteresis effects, due to residual concentration-polarization, manifest themselves through the dependence of the transient current rectification on voltage scan rate.
AB - Ion current rectification inversion is observed in a funnel-shaped nanochannel above a threshold voltage roughly corresponding to the under-limiting to over-limiting current transition. Previous experimental studies have examined rectification at either low-voltages (under-limiting current region) for conical nanopores/funnel-shaped nanochannels or at high-voltages (over-limiting region) for straight nanochannels with asymmetric entrances or asymmetric interfacing microchannels. The observed rectification inversion occurs because the system resistance is shifted, beyond a threshold voltage, from being controlled by intra-channel ion concentration-polarization to that controlled by external concentration-polarization. Additionally, strong hysteresis effects, due to residual concentration-polarization, manifest themselves through the dependence of the transient current rectification on voltage scan rate.
UR - http://www.scopus.com/inward/record.url?scp=84949604258&partnerID=8YFLogxK
U2 - 10.1063/1.4936915
DO - 10.1063/1.4936915
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AN - SCOPUS:84949604258
SN - 0021-9606
VL - 143
JO - Journal of Chemical Physics
JF - Journal of Chemical Physics
IS - 22
M1 - 224706
ER -