TY - JOUR
T1 - Investigation of InP surface and metal interfaces by surface photovoltage and Auger electron spectroscopies
AU - Shapira, Y.
AU - Brillson, L. J.
AU - Heller, A.
PY - 1983/4
Y1 - 1983/4
N2 - We have used surface photovoltage spectroscopy (SPS) and Auger electron spectroscopy (AES) to investigate the extrinsic surface states produced within the InP band gap by a variety of wet chemical treatments as well as by UHV metal chemisorption, oxidation, and Ar+ bombardment. UHV-cleaved surfaces display no intrinsic surface states, only extrinsic states associated with an excess of surface P. We have attempted to correlate the various SPS features with the chemical composition of these surfaces, particularly with KAg(CN)-2-treated surfaces, for which the surface recombination velocity on p-InP is known to decrease significantly.
AB - We have used surface photovoltage spectroscopy (SPS) and Auger electron spectroscopy (AES) to investigate the extrinsic surface states produced within the InP band gap by a variety of wet chemical treatments as well as by UHV metal chemisorption, oxidation, and Ar+ bombardment. UHV-cleaved surfaces display no intrinsic surface states, only extrinsic states associated with an excess of surface P. We have attempted to correlate the various SPS features with the chemical composition of these surfaces, particularly with KAg(CN)-2-treated surfaces, for which the surface recombination velocity on p-InP is known to decrease significantly.
UR - http://www.scopus.com/inward/record.url?scp=0020114086&partnerID=8YFLogxK
U2 - 10.1116/1.571996
DO - 10.1116/1.571996
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AN - SCOPUS:0020114086
SN - 0734-2101
VL - 1
SP - 766
EP - 770
JO - Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
JF - Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
IS - 2
ER -