Interpretation of wave-profile modification measurements in high-gain raman free-electron-laser experiments

E. Jerby*, A. Gover

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Abstract

This paper presents a theoretical analysis of wave-profile modification measurements in FELs, using data that was reported recently [Phys. Rev. Lett. 59 (1987) 1177]. The results are related to a high-gain Raman free-electron laser, operating at long wavelengths (∼ 3 cm). Two possible mechanisms for wave-profile modification were examined. One is the known e-beam optical guiding effect. The other is that of the transverse electrostatic fields (TEF), excited by the bunched electron beam. The numerical results suggest that in the above-mentioned reference the measured wave-profile modification was predominantly a consequence of the TEF components. An experimental setup for verification of this analysis is proposed.

Original languageEnglish
Pages (from-to)128-131
Number of pages4
JournalNuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume285
Issue number1-2
DOIs
StatePublished - 10 Dec 1989

Funding

FundersFunder number
Office of Naval ResearchN00014-87-C0362

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