Interferometric measurement of thermal expansion coefficients and thermo-optic coefficients in ferroelectric crystals

F. Pignatiello, M. De Rosa, P. Ferraro, A. Arie, S. Grilli, L. Sansone, S. De Nicola, P. De Natale

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We demonstrate a dual interferometric technique for simultaneous and independent measurements of the temperature dependence of the thermo-optic and thermal expansion coefficients in ferroelectric crystals. The crystal temperature can be changed from room temperature up to about 200°C by an actively stabilized heater (stability < 0.1°C). The thermal expansion coefficient is determined using a moiré interferometer and monitoring the period of a grating written on the z-face of the crystal sample as a function of the temperature of the crystal. The thermo-optic coefficients of both ordinary and extraordinary axes are estimated by measuring the optical path variation measured by a Mach-Zehnder interferometer with one arm passing through the crystal perpendicularly to the crystal z-axis. This method can be applied to a wide variety of optical materials, when an accurate knowledge of the temperature dependence of the refractive index and thermal expansion is needed.

Original languageEnglish
Title of host publicationOptical Micro- and Nanometrology in Microsystems Technology
DOIs
StatePublished - 2006
EventOptical Micro- and Nanometrology in Microsystems Technology - Strasbourg, France
Duration: 5 Apr 20067 Apr 2006

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6188
ISSN (Print)0277-786X

Conference

ConferenceOptical Micro- and Nanometrology in Microsystems Technology
Country/TerritoryFrance
CityStrasbourg
Period5/04/067/04/06

Keywords

  • Ferroelectric crystals
  • Thermal expansion coefficient
  • Thermo-optic coefficient

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