@inproceedings{6f2e66d362f04c16bd5b732b3e3a791f,
title = "Interferometric measurement of thermal expansion coefficients and thermo-optic coefficients in ferroelectric crystals",
abstract = "We demonstrate a dual interferometric technique for simultaneous and independent measurements of the temperature dependence of the thermo-optic and thermal expansion coefficients in ferroelectric crystals. The crystal temperature can be changed from room temperature up to about 200°C by an actively stabilized heater (stability < 0.1°C). The thermal expansion coefficient is determined using a moir{\'e} interferometer and monitoring the period of a grating written on the z-face of the crystal sample as a function of the temperature of the crystal. The thermo-optic coefficients of both ordinary and extraordinary axes are estimated by measuring the optical path variation measured by a Mach-Zehnder interferometer with one arm passing through the crystal perpendicularly to the crystal z-axis. This method can be applied to a wide variety of optical materials, when an accurate knowledge of the temperature dependence of the refractive index and thermal expansion is needed.",
keywords = "Ferroelectric crystals, Thermal expansion coefficient, Thermo-optic coefficient",
author = "F. Pignatiello and {De Rosa}, M. and P. Ferraro and A. Arie and S. Grilli and L. Sansone and {De Nicola}, S. and {De Natale}, P.",
year = "2006",
doi = "10.1117/12.664037",
language = "אנגלית",
isbn = "0819462446",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
booktitle = "Optical Micro- and Nanometrology in Microsystems Technology",
note = "null ; Conference date: 05-04-2006 Through 07-04-2006",
}