TY - JOUR
T1 - Interfacial collocation equations of thin liquid film in the presence of interfacial shear
T2 - Stability analysis
AU - Brauner, Neima
AU - Maron, David Moalem
AU - Zijl, Wout
PY - 1989
Y1 - 1989
N2 - Stability analysis on counter- and cocurrent sheared falling is considered. The governing equations for the mass continuity and liquid motion of thin-film flow in the presence of interfacial shear are presented in terms of the parameters at the free interface, the so-called collocation line. As the instability phenomenon is associated essentially with characteristics of the near-interface region, a stability analysis is carried out on the interfacial collocation equations and results in simple algebraic "stability equations", which relate the wave characteristics at inception to the interfacial shear, external pressure drop and the Weber and Reynolds numbers of the flow. It is also shown that simple analytical asymptotic solutions can easily be derived from the algebraic equation,.
AB - Stability analysis on counter- and cocurrent sheared falling is considered. The governing equations for the mass continuity and liquid motion of thin-film flow in the presence of interfacial shear are presented in terms of the parameters at the free interface, the so-called collocation line. As the instability phenomenon is associated essentially with characteristics of the near-interface region, a stability analysis is carried out on the interfacial collocation equations and results in simple algebraic "stability equations", which relate the wave characteristics at inception to the interfacial shear, external pressure drop and the Weber and Reynolds numbers of the flow. It is also shown that simple analytical asymptotic solutions can easily be derived from the algebraic equation,.
UR - http://www.scopus.com/inward/record.url?scp=0024925019&partnerID=8YFLogxK
U2 - 10.1016/0009-2509(89)85214-5
DO - 10.1016/0009-2509(89)85214-5
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AN - SCOPUS:0024925019
SN - 0009-2509
VL - 44
SP - 2711
EP - 2722
JO - Chemical Engineering Science
JF - Chemical Engineering Science
IS - 11
ER -