Abstract
A silver halide infrared fiber-optic evanescent wave spectroscopic technique for in-situ monitoring of chemical processes and surface analysis is described. Samples are spread onto a fiber contained in a teflon-lined cell. Attenuated total internal reflectance (ATR) measurement with a Fourier transform infrared (FTIR) spectrometer yields spectra at various stages of a process (for example, the monitoring of adhesive curing and coupling agent polymerization). Changes in known spectroscopic features may be recognized in films as thin as a monolayer. The advantages and limitations of this surface analysis technique are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 145-152 |
| Number of pages | 8 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 1048 |
| DOIs | |
| State | Published - 2 Jun 1989 |