In-situ TEM studies of magnetization reversal processes in magnetic nanostructures

Amandu K. Petford-Long*, Thomas Bromwich, Amit Kohn, Victoria Jackson, Takeshi Kasama, Rufal Dunin-Borkowski, Caroline A. Ross

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

One of the most widely studied types of magnetic nanostructure is that used in devices based on the giant magnetoresistance (GMR) or tunnel magnctoresistance (TMR) phenomena. In order to understand the bchavi.our of these materials it is important to be able to follow their magnetization reversal mechanism, and one of the techniques enabling micromagnetic studies at the sub-micron scale is transmission electron microscopy. Two techniques can be used: Lorentz transmission electron microscopy and off-axis electron holography, both of which allow the magnetic domain structure of a ferromagnetic material to be investigated dynamically in realtime with a resolution of a few nanometres. These techniques have been used in combination with in situ magnetizing experiments, to carry out qualitative and quantitative studies of magnetization reversal in a range of materials including spin-tunnel junctions, patterned thin film elements and magnetic antidot arrays. Quantitative analysis of the Lorentz TEM data has been carried out using the transport of intensity equation (TIE) approach.

Original languageEnglish
Title of host publicationIn Situ Electron Microscopy of Materials
PublisherMaterials Research Society
Pages13-21
Number of pages9
ISBN (Print)1558998624, 9781558998629
DOIs
StatePublished - 2005
Externally publishedYes
Event2005 MRS Fall Meeting - Boston, MA, United States
Duration: 28 Nov 20052 Dec 2005

Publication series

NameMaterials Research Society Symposium Proceedings
Volume907
ISSN (Print)0272-9172

Conference

Conference2005 MRS Fall Meeting
Country/TerritoryUnited States
CityBoston, MA
Period28/11/052/12/05

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