In-operando X-ray tomography study of lithiation induced delamination of Si based anodes for lithium-ion batteries

Farid Tariq, Vladimir Yufit, David S. Eastwood, Yu Merla, Moshiel Biton, Billy Wu, Zhangwei Chen, Kathrin Freedman, Gregory Offer, Emanuel Peled, Peter D. Lee, Diana Golodnitsky, Nigel Brandon

Research output: Contribution to journalArticlepeer-review

63 Scopus citations

Abstract

Silicon-Lithium based rechargeable batteries offer high gravimetric capacity. However cycle life and electrode microstructure failure mechanisms remain poorly understood. Here we present an X-ray tomography method to investigate in-operando lithiation induced stress cracking leading to the delamination of a composite Si based electrode. Simultaneous voltage measurements show increased cell resistance correlating with severe delamination and microstructural changes. 3D analysis revealed 44.1% loss of the initial electrode-current collector area after 1 hour of operation at 2.4 mA/cm 2 and a 21.2% increase in new anode surface area. The work represents a new basis for future investigation of Si based anodes.

Original languageEnglish
Pages (from-to)A76-A78
JournalECS Electrochemistry Letters
Volume3
Issue number7
DOIs
StatePublished - 2014

Funding

FundersFunder number
Engineering and Physical Sciences Research CouncilEP/K002252/1, EP/I02249X/1, EP/I00422X/1

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