Implementation of concurrent checking circuits by independent sub-circuits

Vladimir Ostrovsky, Ilya Levin

Research output: Contribution to journalConference articlepeer-review

Abstract

The present paper proposes a new method for detecting arbitrary faults in a functional circuit when the set of codewords is limited and known in advance. The method is based on implementation of the functional circuit by a plurality of separate independent sub-circuits. Each of such sub-circuits generates its own subset of output signals. Since the sub-circuits do not have common elements, any single fault may result in errors only in one of the subsets. The paper presents a solution of the problem of optimal partition of the set of output variables into independent subsets. A number of properties of partitions are proven. The proposed algorithms of the optimal partition are based on these properties. A scheme of the checker for the proposed self-checking approach is presented. Benchmarks' results indicate efficiency of the described technique.

Original languageEnglish
Pages (from-to)343-351
Number of pages9
JournalProceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
StatePublished - 2005
Externally publishedYes
Event20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2005 - Monterey, CA, United States
Duration: 3 Oct 20055 Oct 2005

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