Abstract
The present paper proposes a new method for detecting arbitrary faults in a functional circuit when the set of codewords is limited and known in advance. The method is based on implementation of the functional circuit by a plurality of separate independent sub-circuits. Each of such sub-circuits generates its own subset of output signals. Since the sub-circuits do not have common elements, any single fault may result in errors only in one of the subsets. The paper presents a solution of the problem of optimal partition of the set of output variables into independent subsets. A number of properties of partitions are proven. The proposed algorithms of the optimal partition are based on these properties. A scheme of the checker for the proposed self-checking approach is presented. Benchmarks' results indicate efficiency of the described technique.
Original language | English |
---|---|
Pages (from-to) | 343-351 |
Number of pages | 9 |
Journal | Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
State | Published - 2005 |
Externally published | Yes |
Event | 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2005 - Monterey, CA, United States Duration: 3 Oct 2005 → 5 Oct 2005 |