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Impact of impedance mismatch of on-die interconnects and logic cells on device reliability and functionality
Pavel Livshits*, Moshe Gurfinkel, Alexander Rysin, Sergey Sofer, Yoram Shapira, Yefim Fefer
*Corresponding author for this work
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
1
Scopus
citations