Impact of impedance mismatch of on-die interconnects and logic cells on device reliability and functionality
- Pavel Livshits*
- , Moshe Gurfinkel
- , Alexander Rysin
- , Sergey Sofer
- , Yoram Shapira
- , Yefim Fefer
*Corresponding author for this work
- Bar-Ilan University
- Tel Aviv University
- NXP Semiconductors
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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