High sensitivity nanoscale mapping of elastic moduli

Yaniv Ganor*, Doron Shilo

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


Recently, a new technique has been developed, which allows quantitative nanoscale mapping of elastic moduli by means of a hybrid nanoindentation and force modulation instrument. We introduce a procedure for finding the experimental parameters that provide an optimal modulus contrast. An application of the procedure on a BaTi O3 single crystal reveals a clear contrast between domains that have different orientations of the tetragonal unit cell. The obtained results are in good agreement with reported bulk elastic moduli and show that the elastic modulus sensitivity is 5%. Thus, the improved modulus mapping procedure can be applied not only to composite materials but also to many multiphase and multidomain material systems.

Original languageEnglish
Article number233122
JournalApplied Physics Letters
Issue number23
StatePublished - 5 Jun 2006
Externally publishedYes


Dive into the research topics of 'High sensitivity nanoscale mapping of elastic moduli'. Together they form a unique fingerprint.

Cite this