Skip to main navigation
Skip to search
Skip to main content
Tel Aviv University Home
Update Request & User Guide (TAU staff only)
Link opens in a new tab
Search content at Tel Aviv University
Home
Experts
Research units
Research output
Datasets
Prizes
Activities
Press/Media
High sensitivity IR spectroscopic methods of self-assembling monolayers (SAM) measurements
A. Inberg
*
, N. Croitoru
, G. Revzin
*
Corresponding author for this work
School of Electrical Engineering
Tel Aviv University
Research output
:
Contribution to journal
›
Article
›
peer-review
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'High sensitivity IR spectroscopic methods of self-assembling monolayers (SAM) measurements'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Spectroscopic Techniques
100%
High Sensitivity
100%
IR Spectroscopy
100%
Self-assembled Monolayer
100%
Hollow Waveguide
66%
Attenuation
33%
Irradiation
33%
Molecular Structure
33%
Linear Dependence
33%
Systems-based
33%
High Signal-to-noise Ratio
33%
Mid-infrared
33%
FTIR Spectra
33%
Signal Amplification
33%
Spectral Signal
33%
Result Interpretation
33%
Signal Sensitivity
33%
High Signal
33%
Half-cylinder
33%
Material Science
Self Assembled Monolayer
100%
Waveguide
66%
Signal-to-Noise Ratio
33%
Molecular Structure
33%
Cylinder
33%
Physics
Waveguide
100%
Signal-to-Noise Ratio
50%
Molecular Structure
50%
Infrared Radiation
50%