High-resolution multi-scan compact Fourier transform-infrared spectrometer

Erga Lifshitz, Uri Arieli, Shahar Katz, Iftach Nir, Assaf Levanon, Michael Mrejen, Haim Suchowski

Research output: Contribution to journalArticlepeer-review

Abstract

The Fourier transform-infrared (FT-IR) spectrometer is a widely used high-resolution spectral characterization method in materials, chemicals, and more. However, the inverse relation between the spectral resolution and the interferometer’s arm length yields a tradeoff between spectral resolution and spectrometer footprint. Here, we introduce a novel method to overcome this traditional FT-IR resolution limit. The enhanced high-resolution multi-scan compact FT-IR spectrometer we present achieves an effectively long interferogram by combining multiple short FT-IR scans. Simulation and experimental results demonstrate a significant increase in the spectral resolution of a FT-IR spectrometer by employing our interferogram stitching algorithm.

Original languageEnglish
Pages (from-to)3126-3129
Number of pages4
JournalOptics Letters
Volume44
Issue number12
DOIs
StatePublished - 2019

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