High resolution DAS via sinusoidal frequency scan OFDR (SFS-OFDR)

Eyal Leviatan, Avishay Eyal

Research output: Contribution to journalArticlepeer-review


There are many advantages to using direct frequency modulation for OFDR based DAS. However, achieving sufficiently linear scan via direct frequency modulation is challenging and poses limits on the scan parameters. A novel method for analyzing sinusoidal frequency modulated light is presented and demonstrated for both static and dynamic sensing. SFS-OFDR projects the measured signal onto appropriate sinusoidal phase terms to obtain spatial information. Thus, by using SFS-OFDR on sinusoidal modulated light it is possible to make use of the many advantages offered by direct frequency modulation without the limitations posed by the linearity requirement.

Original languageEnglish
Pages (from-to)33318-33334
Number of pages17
JournalOptics Express
Issue number26
StatePublished - 28 Dec 2015


Dive into the research topics of 'High resolution DAS via sinusoidal frequency scan OFDR (SFS-OFDR)'. Together they form a unique fingerprint.

Cite this