High pressure ellipsometry: A novel method for measuring the optical properties and electronic structure of materials in diamond anvil cells
- N. Nissim*
- , S. Eliezer
- , L. Bakshi
- , L. Perelmutter
- , M. P. Pasternak
*Corresponding author for this work
- Applied Physics Department
- Tel Aviv University
Research output: Contribution to journal › Article › peer-review
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