High pressure ellipsometry: A novel method for measuring the optical properties and electronic structure of materials in diamond anvil cells

N. Nissim*, S. Eliezer, L. Bakshi, L. Perelmutter, M. P. Pasternak

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'High pressure ellipsometry: A novel method for measuring the optical properties and electronic structure of materials in diamond anvil cells'. Together they form a unique fingerprint.

Physics & Astronomy

Engineering & Materials Science

Medicine & Life Sciences