Heat currents in electronic junctions driven by telegraph noise

O. Entin-Wohlman*, D. Chowdhury, A. Aharony, S. Dattagupta

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

13 Scopus citations

Abstract

The energy and charge fluxes carried by electrons in a two-terminal junction subjected to a random telegraph noise, produced by a single electronic defect, are analyzed. The telegraph processes are imitated by the action of a stochastic electric field that acts on the electrons in the junction. Upon averaging over all random events of the telegraph process, it is found that this electric field supplies, on the average, energy to the electronic reservoirs, which is distributed unequally between them: the stronger is the coupling of the reservoir with the junction, the more energy it gains. Thus the noisy environment can lead to a temperature gradient across an unbiased junction.

Original languageEnglish
Article number195435
JournalPhysical Review B
Volume96
Issue number19
DOIs
StatePublished - 28 Nov 2017

Funding

FundersFunder number
Pazi foundation
Indian National Science Academy
Israel Science Foundation
Ministry of Science and Technology, Israel3-11173

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