TY - GEN
T1 - Harnessing machine learning to improve the success rate of stimuli generation
AU - Fine, Shai
AU - Freund, Ari
AU - Jaeger, Itai
AU - Naveh, Yehuda
AU - Ziv, Avi
AU - Mansour, Yishay
PY - 2005
Y1 - 2005
N2 - The initial state of a design under verification has a major impact on the ability of stimuli generators to successfully generate the requested stimuli. For complexity reasons, most stimuli generators use sequential solutions without planning ahead. Therefore, in many cases they fail to produce a consistent stimuli due to an inadequate selection of the initial state. We propose a new method, based on machine learning techniques, to improve generation success by learning the relationship between the initial state vector and generation success. We applied the proposed method in two different settings, with the objective of improving generation success and coverage in processor and system level generation. In both settings, the proposed method significantly reduced generation failures and enabled faster coverage.
AB - The initial state of a design under verification has a major impact on the ability of stimuli generators to successfully generate the requested stimuli. For complexity reasons, most stimuli generators use sequential solutions without planning ahead. Therefore, in many cases they fail to produce a consistent stimuli due to an inadequate selection of the initial state. We propose a new method, based on machine learning techniques, to improve generation success by learning the relationship between the initial state vector and generation success. We applied the proposed method in two different settings, with the objective of improving generation success and coverage in processor and system level generation. In both settings, the proposed method significantly reduced generation failures and enabled faster coverage.
UR - http://www.scopus.com/inward/record.url?scp=33846635953&partnerID=8YFLogxK
U2 - 10.1109/HLDVT.2005.1568823
DO - 10.1109/HLDVT.2005.1568823
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AN - SCOPUS:33846635953
SN - 0780395719
SN - 9780780395718
T3 - Proceedings - IEEE International High-Level Design Validation and Test Workshop, HLDVT
SP - 112
EP - 118
BT - Proceedings - Tenth Annual IEEE International High Level Design Validation and Test Workshop, HLDVT'05
Y2 - 30 November 2005 through 2 December 2005
ER -