Genome-wide mapping of loci for adult-plant resistance to stripe rust in durum wheat svevo using the 90k snp array

Xinli Zhou, Xiao Zhong, Jonatan Roter, Xin Li, Qiang Yao, Jiahui Yan, Suizhuang Yang, Qingyun Guo, Assaf Distelfeld, Hanan Sela, Zhensheng Kang

Research output: Contribution to journalArticlepeer-review

Abstract

Stripe rust is a foliar disease in wheat caused by Puccinia striiformis f. tritici. The best way to protect wheat from this disease is by growing resistant cultivars. Tetraploid wheat can serve as a good source of valuable genetic diversity for various traits. Here, we report the mapping of nine stripe rust resistance quantitative trait loci (QTL) effective against P. striiformis f. tritici in China and Israel. We used recombinant inbred lines (RILs) developed from a cross between the durum wheat cultivar Svevo and Triticum dicoccoides accession Zavitan. By genotyping the RIL population of 137 lines using the wheat 90K single-nucleotide polymorphism array, we mapped an adult-plant resistance locus QYrsv. swust-1BL.1, the most effective QTL, within a 0.75-centimorgan region in T. turgidum subsp. durum 'Svevo' on chromosome arm 1BL, corresponding to the region of 670.7 to 671.5 Mb on the Chinese Spring chromosome arm 1BL. Of the other eight minor-effect stripe rust QTL, seven were from Svevo and mapped on chromosomes 1A, 1B, 2B, 3A, 4A, and 5A, and one was from Zavitan and mapped on chromosome 2A. Several QTL with epistatic effects were identified as well. The markers linked to the resistance QTL can be useful in marker-assisted selection for incorporation of these resistance QTL into both durum and common wheat cultivars.

Original languageEnglish
Pages (from-to)879-888
Number of pages10
JournalPlant Disease
Volume105
Issue number4
Early online date3 Nov 2020
DOIs
StatePublished - Apr 2021

Keywords

  • Cereals and grains
  • Cultivar/resistance
  • Disease management
  • Field crops
  • Fungi
  • QTL mapping
  • Stripe rust
  • Wild emmer wheat
  • Yellow rust

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