General resistance crossover expressions for three-dimensional variable-range hopping

Nguyen Van Lien; Ralph Rosenbaum

doi:10.1088/0953-8984/10/27/009

General resistance crossover expressions for three-dimensional variable-range hopping

Nguyen Van Lien^*, Ralph Rosenbaum

^*Corresponding author for this work

School of Physics and Astronomy

Vietnamese Academy of Science and Technology

Research output: Contribution to journal › Article › peer-review

17 Scopus citations

Abstract

We observe a crossover in the temperature dependence of the variable-range-hopping resistivity in a three-dimensional nickel-silicon film from the Mott T^-1/4-behaviour to the soft-gap T^-v-behaviour with v ≈ 0.72. We propose general expressions for describing such crossovers from T^-1/4-behaviour to T^-v-behaviour for any v from 1/4 to 1. The theoretical expressions fit the experimental data well.

Original language	English
Pages (from-to)	6083-6090
Number of pages	8
Journal	Journal of Physics Condensed Matter
Volume	10
Issue number	27
DOIs	https://doi.org/10.1088/0953-8984/10/27/009
State	Published - 13 Jul 1998

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abstract = "We observe a crossover in the temperature dependence of the variable-range-hopping resistivity in a three-dimensional nickel-silicon film from the Mott T-1/4-behaviour to the soft-gap T-v-behaviour with v ≈ 0.72. We propose general expressions for describing such crossovers from T-1/4-behaviour to T-v-behaviour for any v from 1/4 to 1. The theoretical expressions fit the experimental data well.",

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AB - We observe a crossover in the temperature dependence of the variable-range-hopping resistivity in a three-dimensional nickel-silicon film from the Mott T-1/4-behaviour to the soft-gap T-v-behaviour with v ≈ 0.72. We propose general expressions for describing such crossovers from T-1/4-behaviour to T-v-behaviour for any v from 1/4 to 1. The theoretical expressions fit the experimental data well.

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General resistance crossover expressions for three-dimensional variable-range hopping

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