General resistance crossover expressions for three-dimensional variable-range hopping

Nguyen Van Lien*, Ralph Rosenbaum

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

We observe a crossover in the temperature dependence of the variable-range-hopping resistivity in a three-dimensional nickel-silicon film from the Mott T-1/4-behaviour to the soft-gap T-v-behaviour with v ≈ 0.72. We propose general expressions for describing such crossovers from T-1/4-behaviour to T-v-behaviour for any v from 1/4 to 1. The theoretical expressions fit the experimental data well.

Original languageEnglish
Pages (from-to)6083-6090
Number of pages8
JournalJournal of Physics Condensed Matter
Volume10
Issue number27
DOIs
StatePublished - 13 Jul 1998

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