TY - GEN
T1 - Gaussian beam summation analysis of half plane diffraction
T2 - 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2008
AU - Katsav, M.
AU - Heyman, E.
PY - 2008
Y1 - 2008
N2 - A Gaussian beam summation (GBS) representation for a three-dimensional half-plane diffraction of a Gaussian beam (GB) that hits arbitrarily close to the edge is presented. The expansion involves an angular spectrum of GB's in the plane normal to the edge and a discrete phase-space decomposition along the edge. The field is thus described as a sum of GB's emerging from a discrete set of points along the edge, at a discrete set of directions in a polar coordinate system. Expressions for the excitation amplitudes of the diffracted beams are derived and validated numerically.
AB - A Gaussian beam summation (GBS) representation for a three-dimensional half-plane diffraction of a Gaussian beam (GB) that hits arbitrarily close to the edge is presented. The expansion involves an angular spectrum of GB's in the plane normal to the edge and a discrete phase-space decomposition along the edge. The field is thus described as a sum of GB's emerging from a discrete set of points along the edge, at a discrete set of directions in a polar coordinate system. Expressions for the excitation amplitudes of the diffracted beams are derived and validated numerically.
KW - Beam-to-beam scattering matrix
KW - Edge-diffraction
KW - Gaussian beam summation method
KW - Uniform asymptotics
UR - http://www.scopus.com/inward/record.url?scp=62749159974&partnerID=8YFLogxK
U2 - 10.1109/EEEI.2008.4736712
DO - 10.1109/EEEI.2008.4736712
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AN - SCOPUS:62749159974
SN - 9781424424825
T3 - IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings
SP - 313
EP - 317
BT - 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2008
Y2 - 3 December 2008 through 5 December 2008
ER -