Gas Sensing Through Mixed Polarization in Birefringent Porous Silicon Thin Film

Keren Hakshur; Sivan Trajtenberg-Mills; Shlomo Ruschin

doi:10.1109/LSENS.2019.2910162

Gas Sensing Through Mixed Polarization in Birefringent Porous Silicon Thin Film

Keren Hakshur, Sivan Trajtenberg-Mills, Shlomo Ruschin^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

1 Scopus citations

Abstract

We interrogate a sensor based on a highly birefringent film, irradiated by an incident beam whose polarization is oriented 45° with respect to the normal film axes. The reflected spectrum is shown to display exceptional features and resolve some outstanding issues in interferometric sensing. By means of optical signal processing based on Fourier analysis, three different periodicity patterns can be elucidated when sensing a single event, improving the sensing process in several ways: It allows sensing at several sensitivity scales, and it clears out the problems of phase and direction ambiguities. A novel effect is observed in which the phase displacement of different patterns move in opposite directions as sensing takes place. We present a theoretical analysis of the process, as well as experimental measurements with different ethanol concentrations.

Original language	English
Article number	8685157
Journal	IEEE Sensors Letters
Volume	3
Issue number	5
DOIs	https://doi.org/10.1109/LSENS.2019.2910162
State	Published - May 2019

Keywords

Sensor materials
birefringent
interferometry
porous silicon

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10.1109/LSENS.2019.2910162

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title = "Gas Sensing Through Mixed Polarization in Birefringent Porous Silicon Thin Film",

abstract = "We interrogate a sensor based on a highly birefringent film, irradiated by an incident beam whose polarization is oriented 45° with respect to the normal film axes. The reflected spectrum is shown to display exceptional features and resolve some outstanding issues in interferometric sensing. By means of optical signal processing based on Fourier analysis, three different periodicity patterns can be elucidated when sensing a single event, improving the sensing process in several ways: It allows sensing at several sensitivity scales, and it clears out the problems of phase and direction ambiguities. A novel effect is observed in which the phase displacement of different patterns move in opposite directions as sensing takes place. We present a theoretical analysis of the process, as well as experimental measurements with different ethanol concentrations.",

keywords = "Sensor materials, birefringent, interferometry, porous silicon",

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AB - We interrogate a sensor based on a highly birefringent film, irradiated by an incident beam whose polarization is oriented 45° with respect to the normal film axes. The reflected spectrum is shown to display exceptional features and resolve some outstanding issues in interferometric sensing. By means of optical signal processing based on Fourier analysis, three different periodicity patterns can be elucidated when sensing a single event, improving the sensing process in several ways: It allows sensing at several sensitivity scales, and it clears out the problems of phase and direction ambiguities. A novel effect is observed in which the phase displacement of different patterns move in opposite directions as sensing takes place. We present a theoretical analysis of the process, as well as experimental measurements with different ethanol concentrations.

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Gas Sensing Through Mixed Polarization in Birefringent Porous Silicon Thin Film

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