Gas Sensing Through Mixed Polarization in Birefringent Porous Silicon Thin Film

Keren Hakshur, Sivan Trajtenberg-Mills, Shlomo Ruschin

Research output: Contribution to journalArticlepeer-review

Abstract

We interrogate a sensor based on a highly birefringent film, irradiated by an incident beam whose polarization is oriented 45° with respect to the normal film axes. The reflected spectrum is shown to display exceptional features and resolve some outstanding issues in interferometric sensing. By means of optical signal processing based on Fourier analysis, three different periodicity patterns can be elucidated when sensing a single event, improving the sensing process in several ways: It allows sensing at several sensitivity scales, and it clears out the problems of phase and direction ambiguities. A novel effect is observed in which the phase displacement of different patterns move in opposite directions as sensing takes place. We present a theoretical analysis of the process, as well as experimental measurements with different ethanol concentrations.

Original languageEnglish
Article number8685157
JournalIEEE Sensors Letters
Volume3
Issue number5
DOIs
StatePublished - May 2019

Keywords

  • Sensor materials
  • birefringent
  • interferometry
  • porous silicon

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