TY - GEN
T1 - Fundamental limits on ultrafast electron holography
AU - Schaap, Walter
AU - Mechel, Chen
AU - Ruimy, Ron
AU - Niedermayr, Arthur
AU - Israel, Yonatan
AU - Gorlach, Alexey
AU - Dunin-Borkowski, Rafal
AU - Luiten, Jom
AU - Kaminer, Ido
N1 - Publisher Copyright:
© 2025 IEEE.
PY - 2025
Y1 - 2025
N2 - The ultrafast transmission electron microscope (UTEM) enables imaging of dynamical phenomena down to the femtosecond temporal regime, with sub-nanometer spatial resolution [1]. Techniques like photon-induced nearfield electron microscopy (PINEM) provide access to the dynamics of optical excitations such as photons, plasmons, and phonon-polaritons, by relying on the inelastic interaction of electrons with the optical fields.
AB - The ultrafast transmission electron microscope (UTEM) enables imaging of dynamical phenomena down to the femtosecond temporal regime, with sub-nanometer spatial resolution [1]. Techniques like photon-induced nearfield electron microscopy (PINEM) provide access to the dynamics of optical excitations such as photons, plasmons, and phonon-polaritons, by relying on the inelastic interaction of electrons with the optical fields.
UR - https://www.scopus.com/pages/publications/105016199157
U2 - 10.1109/CLEO/EUROPE-EQEC65582.2025.11109684
DO - 10.1109/CLEO/EUROPE-EQEC65582.2025.11109684
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AN - SCOPUS:105016199157
T3 - 2025 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2025
BT - 2025 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2025
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2025 Conference on Lasers and Electro-Optics Europe and European Quantum Electronics Conference, CLEO/Europe-EQEC 2025
Y2 - 23 June 2025 through 27 June 2025
ER -