TY - JOUR
T1 - Functional verification of instruction processing units through control flow modeling
AU - Feig, Rami
AU - Weiss, Shlomo
PY - 2002/3
Y1 - 2002/3
N2 - The design verification of state-of-the-art high-performance microprocessors has become a significant challenge for test engineers. Deep pipelines, multiple execution units, out-of-order and speculative execution techniques, typically found in such microprocessors, contribute much to this complexity. Conventional methods, which treat the processor as a logic state machine or apply architectural level tests, fail to provide coverage of all possible corner cases in the design. This paper presents a functional verification method for modern microprocessors, which is based on innovative models of the microprocessor architecture, intended to cover the testing of all corner cases. In order to test the models presented in this work, an architecture independent coverage measurement system has been developed. The models were tested with both random code and real world applications in order to determine which of the two achieves higher coverage.
AB - The design verification of state-of-the-art high-performance microprocessors has become a significant challenge for test engineers. Deep pipelines, multiple execution units, out-of-order and speculative execution techniques, typically found in such microprocessors, contribute much to this complexity. Conventional methods, which treat the processor as a logic state machine or apply architectural level tests, fail to provide coverage of all possible corner cases in the design. This paper presents a functional verification method for modern microprocessors, which is based on innovative models of the microprocessor architecture, intended to cover the testing of all corner cases. In order to test the models presented in this work, an architecture independent coverage measurement system has been developed. The models were tested with both random code and real world applications in order to determine which of the two achieves higher coverage.
KW - Coverage measurement
KW - Functional verification
KW - Pipeline
UR - http://www.scopus.com/inward/record.url?scp=0036498466&partnerID=8YFLogxK
U2 - 10.1016/S0026-2692(01)00139-2
DO - 10.1016/S0026-2692(01)00139-2
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AN - SCOPUS:0036498466
SN - 0026-2692
VL - 33
SP - 285
EP - 299
JO - Microelectronics Journal
JF - Microelectronics Journal
IS - 3
ER -