Abstract
The finite frequency voltage fluctuations of single electron transistor (SET) island biased in the transport mode were evaluated. An expression was derived for the voltage noise of a SET valid in the entire frequency range from low frequency classical shot noise to high frequency quantum noise. The expression was used to analyze the back-action of the SET on the single-Cooper-pair box (SCB). Single-shot readout of a SCB qubit using radio-frequency single electron transistor (RFSET) was found to be possible using the information about back-action.
| Original language | English |
|---|---|
| Article number | 046802 |
| Pages (from-to) | 468021-468024 |
| Number of pages | 4 |
| Journal | Physical Review Letters |
| Volume | 88 |
| Issue number | 4 |
| State | Published - 28 Jan 2002 |
| Externally published | Yes |