Frequency noise of a microchip raman laser

Tao Lu, Lan Yang, Tal Carmon, Bumki Min, Kerry Vahala

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

We report measurement of the fundamental component of frequency noise in a micro-Raman laser fabricated on a silicon chip. A frequency noise spectral component that is equivalent to a Schawlow-Townes linewidth of 3-Hz is measured.

Original languageEnglish
Title of host publication2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009
StatePublished - 2009
Externally publishedYes
Event2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009 - Baltimore, MD, United States
Duration: 2 Jun 20094 Jun 2009

Publication series

Name2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009

Conference

Conference2009 Conference on Lasers and Electro-Optics and 2009 Conference on Quantum Electronics and Laser Science Conference, CLEO/QELS 2009
Country/TerritoryUnited States
CityBaltimore, MD
Period2/06/094/06/09

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