Flat metamorphic InAlAs buffer layer on GaAs(111)A misoriented substrates by growth kinetics control

Artur Tuktamyshev*, Stefano Vichi, Federico Cesura, Alexey Fedorov, Sergio Bietti, Daniel Chrastina, Shiro Tsukamoto, Stefano Sanguinetti

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

We have successfully grown, through the detailed control of the growth kinetics, flat InAlAs metamorphic buffer layers on 2-off GaAs(111)A substrates using molecular beam epitaxy. Almost full plastic relaxation is obtained for a layer thickness > 40 nm. The control of an adatom diffusion length and a step ejection probability from the bunches permits a reduction of the InAlAs epilayer root-mean-square surface roughness to 0.55 nm.

Original languageEnglish
Article number126906
JournalJournal of Crystal Growth
Volume600
DOIs
StatePublished - 15 Dec 2022
Externally publishedYes

Keywords

  • A1. Crystal morphology
  • A2. Single crystal growth
  • A3. Molecular beam epitaxy
  • B2. Semiconducting III–V materials
  • B3. Infrared devices

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