Ferroelectric domain engineering using atomic force microscopy tip arrays in the domain breakdown regime

Y. Rosenwaks*, D. Dahan, M. Molotskii, G. Rosenman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

26 Scopus citations

Abstract

One of the main obstacles to ultrahigh-density scanning probe ferroelectric-based devices is the writing speed of the device when using a single tip. We report here on the application of atomic force microscopy tip arrays for nanodomain engineering in ferroelectric crystals under the domain breakdown conditions. Using a multiple-tip array, it is shown that domain writing in 200-μm-thick RbTiOP O4 crystals results in a regular one-dimensional domain grating that penetrates throughout the bulk crystal as in the case of single tip writing. This multiple tip approach paves the way to the use of scanning probe microscopy for fabrication of various nanodomain configurations for advanced optoelectronic and microelectronic devices.

Original languageEnglish
Article number012909
Pages (from-to)012909-1-012909-3
JournalApplied Physics Letters
Volume86
Issue number1
DOIs
StatePublished - Jan 2005

Funding

FundersFunder number
Ministry of Science and Technology of Israel637
US-Israel Binational Science Foundation
United States-Israel Binational Science Foundation
Tel Aviv University2284

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