@article{fc87dec2b5c54722a60a231d8dc8560f,
title = "Ferroelectric domain engineering using atomic force microscopy tip arrays in the domain breakdown regime",
abstract = "One of the main obstacles to ultrahigh-density scanning probe ferroelectric-based devices is the writing speed of the device when using a single tip. We report here on the application of atomic force microscopy tip arrays for nanodomain engineering in ferroelectric crystals under the domain breakdown conditions. Using a multiple-tip array, it is shown that domain writing in 200-μm-thick RbTiOP O4 crystals results in a regular one-dimensional domain grating that penetrates throughout the bulk crystal as in the case of single tip writing. This multiple tip approach paves the way to the use of scanning probe microscopy for fabrication of various nanodomain configurations for advanced optoelectronic and microelectronic devices.",
author = "Y. Rosenwaks and D. Dahan and M. Molotskii and G. Rosenman",
note = "Funding Information: This research was supported by Ministry of Science and Technology of Israel (Grant No. 637), and by Tel Aviv University Klal Consortium for Nanoscience & Nanotechnology (Grant No. 2284), and by the US-Israel Binational Science Foundation (BSF). ",
year = "2005",
month = jan,
doi = "10.1063/1.1847711",
language = "אנגלית",
volume = "86",
pages = "012909--1--012909--3",
journal = "Applied Physics Letters",
issn = "0003-6951",
publisher = "American Institute of Physics",
number = "1",
}