Evidence for pre-melting surface loosening of lead clusters embedded in a silicon monoxide matrix

Y. Lereah; G. Deutscher; R. Kofman

doi:10.1209/0295-5075/8/1/010

Evidence for pre-melting surface loosening of lead clusters embedded in a silicon monoxide matrix

Y. Lereah, G. Deutscher, R. Kofman

School of Physics and Astronomy

Research output: Contribution to journal › Article › peer-review

Abstract

We have studied, by dark-field electron microscopy, the melting of lead clusters of about 200 Å in size embedded in a SiO matrix. Structural changes are observed before the melting temperature T_m is reached. At low temperatures (T < 290 C) their frequency is temperature independent and seems to be dominated by the intensity of the electron beam. Close to T_m the frequency becomes strongly temperature dependent. The data suggest that it diverges at T_m. This behaviour is interpreted as indicative of activated rotation of the clusters in the SiO host matrix prior to bulk melting.

Original language	English
Pages (from-to)	53-57
Number of pages	5
Journal	Journal de Physique (Paris), Lettres
Volume	8
Issue number	1
DOIs	https://doi.org/10.1209/0295-5075/8/1/010
State	Published - 1 Jan 1989

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10.1209/0295-5075/8/1/010

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title = "Evidence for pre-melting surface loosening of lead clusters embedded in a silicon monoxide matrix",

abstract = "We have studied, by dark-field electron microscopy, the melting of lead clusters of about 200 {\AA} in size embedded in a SiO matrix. Structural changes are observed before the melting temperature Tm is reached. At low temperatures (T < 290 C) their frequency is temperature independent and seems to be dominated by the intensity of the electron beam. Close to Tm the frequency becomes strongly temperature dependent. The data suggest that it diverges at Tm. This behaviour is interpreted as indicative of activated rotation of the clusters in the SiO host matrix prior to bulk melting.",

author = "Y. Lereah and G. Deutscher and R. Kofman",

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N2 - We have studied, by dark-field electron microscopy, the melting of lead clusters of about 200 Å in size embedded in a SiO matrix. Structural changes are observed before the melting temperature Tm is reached. At low temperatures (T < 290 C) their frequency is temperature independent and seems to be dominated by the intensity of the electron beam. Close to Tm the frequency becomes strongly temperature dependent. The data suggest that it diverges at Tm. This behaviour is interpreted as indicative of activated rotation of the clusters in the SiO host matrix prior to bulk melting.

AB - We have studied, by dark-field electron microscopy, the melting of lead clusters of about 200 Å in size embedded in a SiO matrix. Structural changes are observed before the melting temperature Tm is reached. At low temperatures (T < 290 C) their frequency is temperature independent and seems to be dominated by the intensity of the electron beam. Close to Tm the frequency becomes strongly temperature dependent. The data suggest that it diverges at Tm. This behaviour is interpreted as indicative of activated rotation of the clusters in the SiO host matrix prior to bulk melting.

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Evidence for pre-melting surface loosening of lead clusters embedded in a silicon monoxide matrix

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