Evidence for pre-melting surface loosening of lead clusters embedded in a silicon monoxide matrix

Y. Lereah, G. Deutscher, R. Kofman

Research output: Contribution to journalArticlepeer-review

Abstract

We have studied, by dark-field electron microscopy, the melting of lead clusters of about 200 Å in size embedded in a SiO matrix. Structural changes are observed before the melting temperature Tm is reached. At low temperatures (T < 290 C) their frequency is temperature independent and seems to be dominated by the intensity of the electron beam. Close to Tm the frequency becomes strongly temperature dependent. The data suggest that it diverges at Tm. This behaviour is interpreted as indicative of activated rotation of the clusters in the SiO host matrix prior to bulk melting.

Original languageEnglish
Pages (from-to)53-57
Number of pages5
JournalJournal de Physique (Paris), Lettres
Volume8
Issue number1
DOIs
StatePublished - 1 Jan 1989

Fingerprint

Dive into the research topics of 'Evidence for pre-melting surface loosening of lead clusters embedded in a silicon monoxide matrix'. Together they form a unique fingerprint.

Cite this