Evidence for a bulk complex order parameter in Y0.9Ca 0.1Ba2Cu3O7-δ thin films

E. Farber, G. Deutscher, B. Gorshunov, M. Dressel

Research output: Contribution to journalArticlepeer-review

Abstract

We have measured the penetration depth of overdoped Y0.9Ca 0.1Ba2Cu3O7-δ (Ca-YBCO) thin films using two different methods. The change of the penetration depth as a function of temperature has been measured using the parallel-plate resonator (PPR), while its absolute value was obtained from a quasi-optical transmission measurement. Both sets of measurements are compatible with an order parameter of the form ΔΔdx2-y2 + iδdxy, with Δ = 14.5 ± 1.5 meV and δ= 1.8 meV, indicating a finite gap at low temperature. Below 15 K, the drop of the scattering rate of uncondensed carriers becomes steeper in contrast to a flattening observed for optimally doped YBCO films. This decrease supports our results on the penetration depth temperature dependence. The findings are in agreement with tunneling measurements on similar Ca-YBCO thin films.

Original languageEnglish
Pages (from-to)834-839
Number of pages6
JournalEurophysics Letters
Volume67
Issue number5
DOIs
StatePublished - 1 Sep 2004

Fingerprint

Dive into the research topics of 'Evidence for a bulk complex order parameter in Y0.9Ca 0.1Ba2Cu3O7-δ thin films'. Together they form a unique fingerprint.

Cite this