Erratum: Low-temperature film thickness measurements by a quartz thickness monitor (Journal of Applied Physics (1977) 48 (3116))

P. H. Barrett^*, M. Pasternak

^*Corresponding author for this work

Research output: Contribution to journal › Comment/debate

3 Scopus citations

Access to Document

@article{e73e934a5d064b3e84904ded998f1f69,

title = "Erratum: Low-temperature film thickness measurements by a quartz thickness monitor (Journal of Applied Physics (1977) 48 (3116))",

author = "Barrett, {P. H.} and M. Pasternak",

year = "1977",

doi = "10.1063/1.324303",

language = "אנגלית",

volume = "48",

pages = "5392--5393",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "12",

}

TY - JOUR

T1 - Erratum

T2 - Low-temperature film thickness measurements by a quartz thickness monitor (Journal of Applied Physics (1977) 48 (3116))

AU - Barrett, P. H.

AU - Pasternak, M.

PY - 1977

Y1 - 1977

UR - http://www.scopus.com/inward/record.url?scp=36749108783&partnerID=8YFLogxK

U2 - 10.1063/1.324303

DO - 10.1063/1.324303

M3 - ???researchoutput.researchoutputtypes.contributiontojournal.comment???

AN - SCOPUS:36749108783

SN - 0021-8979

VL - 48

SP - 5392

EP - 5393

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 12

ER -