Erratum: Low-temperature film thickness measurements by a quartz thickness monitor (Journal of Applied Physics (1977) 48 (3116))

P. H. Barrett*, M. Pasternak

*Corresponding author for this work

Research output: Contribution to journalComment/debate

Original languageEnglish
Pages (from-to)5392-5393
Number of pages2
JournalJournal of Applied Physics
Volume48
Issue number12
DOIs
StatePublished - 1977
Externally publishedYes

Cite this