Electronic reconstruction and enhanced superconductivity at La 1.6xNd 0.4Sr xCuO 4/La 1.55Sr 0.45CuO 4 bilayer interface

P. K. Rout*, P. C. Joshi, Rajni Porwal, R. C. Budhani

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

We report enhanced superconductivity in bilayer thin films consisting of superconducting La 1.6xNd 0.4Sr xCuO 4 with 0.06x<0.20 and metallic but non-superconducting La 1.55Sr 0.45CuO 4. These bilayers show a maximum increase in superconducting transition temperature (T c) of more than 200% for x=0.06, while no change in T c is observed for the bilayers with x0.20. The analysis of the critical current and kinetic inductance data suggests 2-3 unit cells thick interfacial layer electronically perturbed to have a higher T c. A simple charge transfer model with cation intermixing explains the observed T c in bilayers. Still the unusually large thickness of interfacial superconducting layers cannot be explained in terms of this model. We believe that the stripe relaxation as well as the proximity effect also influence the superconductivity of the interface.

Original languageEnglish
Article number67007 (6pp)
JournalJournal de Physique (Paris), Lettres
Volume98
Issue number6
DOIs
StatePublished - Jun 2012
Externally publishedYes

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