Electronic circuit reliability modeling

Joseph B. Bernstein*, Moshe Gurfinkel, Xiaojun Li, Jörg Walters, Yoram Shapira, Michael Talmor

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


The intrinsic failure mechanisms and reliability models of state-of-the-art MOSFETs are reviewed. The simulation tools and failure equivalent circuits are described. The review includes historical background as well as a new approach for accurately predicting circuit reliability and failure rate from the system point of view.

Original languageEnglish
Pages (from-to)1957-1979
Number of pages23
JournalMicroelectronics Reliability
Issue number12
StatePublished - Dec 2006
Externally publishedYes


Dive into the research topics of 'Electronic circuit reliability modeling'. Together they form a unique fingerprint.

Cite this