Electric-field-induced internal deformation in piezoelectric BiB 3O6 crystals

O. Schmidt*, S. Gorfman, U. Pietsch

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Scopus citations


For the first time electric-field-induced atomic displacements (internal strains) in non-ferroelectric polar BiB3O6 single crystal plates (point symmetry 2) were investigated using X-ray diffraction technique. The intensity variations of selected Bragg reflections were collected for three different orientations of the applied external electric field vector with respect to the crystal lattice and used for calculating the microscopic structural response of BiB3O6. Due to the limited number of the reflections providing measurable changes in Bragg intensities we restricted ourselves in analyzing the shift of the B3O6 sublattice relative to the Bi one. In addition, we considered the deformation of the Bi-O, B(1)-O and B(2)-O bond lengths and identified the [B(2)O3] group as the most sensitive structural unit to an external electric perturbation. 2008 WILEYNCH Verlag GmbH & Co. KGaA.

Original languageEnglish
Pages (from-to)1126-1132
Number of pages7
JournalCrystal Research and Technology
Issue number11
StatePublished - Nov 2008
Externally publishedYes


  • Atomic response to an external electric field
  • Bithmut triborate (BiBO)
  • Dielectric polarization
  • Piezoelectric effect
  • X-ray diffraction


Dive into the research topics of 'Electric-field-induced internal deformation in piezoelectric BiB 3O6 crystals'. Together they form a unique fingerprint.

Cite this