Effects of oxygen partial pressure during deposition on the properties of ion-beam-sputtered indium-tin oxide thin films

J. Bregman*, Yoram Shapira, H. Aharoni

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

21 Scopus citations

Fingerprint

Dive into the research topics of 'Effects of oxygen partial pressure during deposition on the properties of ion-beam-sputtered indium-tin oxide thin films'. Together they form a unique fingerprint.

Physics & Astronomy