Effect of thermal-bleaching on the structure and optical properties of thermally evaporated Ge 34Ga 2S 64 film

Yu Chen*, Xiang Shen, Guo Xiang Wang, Jing Fu, Fen Chen, Jun Li, Wei Zhang, Chang Gui Lin, Shi Xun Dai, Tie Feng Xu, Qiu Hua Nie

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

Amorphous films of Ge 34Ga 2S 64 were deposited on quartz substrates by using thermal evaporation method. The optical parameters of as-deposited and annealed films are calculated using the Swanepoel method and Tauc law from the optical transmission spectra. After the heat treatment of as-deposited films at 375°C for 2 h, the thermal-bleaching effects are observed, which are related to the reduction of clusters and fragments, as well as the density of homopolar bonds confirmed by the Raman spectra. As a result, the absorption spectra are blue shifted, the optical band gap of the studied films is increased by 0.118 eV, and the surface roughness is decreased by 0.515 nm.

Original languageEnglish
Pages (from-to)718-723
Number of pages6
JournalGuangdianzi Jiguang/Journal of Optoelectronics Laser
Volume23
Issue number4
StatePublished - Apr 2012
Externally publishedYes

Keywords

  • Ge-Ga-S film
  • Optical parameters
  • Raman structure
  • Thermal evaporation
  • Thermal-bleaching

Fingerprint

Dive into the research topics of 'Effect of thermal-bleaching on the structure and optical properties of thermally evaporated Ge 34Ga 2S 64 film'. Together they form a unique fingerprint.

Cite this