Abstract
A recently reported decrease of the reverse current in β-FeSi 2-n-type Si diodes under sub-band-gap illumination is theoretically considered. It is shown that this effect can be explained through a reduction of the generation component of the reverse current, which is caused by a decrease in the width of the space charge region due to illumination-induced charging of deep impurities. Physical modeling of the effect is also presented.
Original language | English |
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Pages (from-to) | 2214-2216 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 61 |
Issue number | 18 |
DOIs | |
State | Published - 1992 |