Effect of field-focusing and ion selectivity on the extended space charge developed at the microchannel-nanochannel interface

Uri Liel, Neta Leibowitz, Jarrod Schiffbauer, Sinwook Park, Gilad Yossifon

Research output: Contribution to journalArticlepeer-review

Abstract

We present results demonstrating the effect of varying microchannel depth and bulk conductivity on the space charge-mediated transition between classical, diffusion-limited current and over-limiting current in microchannel-nanochannel devices. The extended space charge layer develops at the depleted microchannel-nanochannel entrance when the limiting current is exceeded and is correlated with a distinctive maximum in the dc resistance. This maximum is shown to be affected by the microchannel depth, via field-focusing, and solution conductivity. In particular, we observe that upon their increase, the maximum becomes flatter and shifts to higher voltages.

Original languageEnglish
Article number324002
JournalJournal of Physics Condensed Matter
Volume28
Issue number32
DOIs
StatePublished - 21 Jun 2016
Externally publishedYes

Keywords

  • concentration polarization
  • extended space charge
  • microchannel-nanochannel interface device

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