Effect of diffusion layer structure on the electroreflectance of metals

M. I. Urbakh, A. B. Ershler

Research output: Contribution to journalArticlepeer-review


The component of electroreflectance (ER) of metals due to the modulation of the diffusion layer characteristics has been investigated. It has been shown that the contribution of this effect to the total ER signal is greatest at large incidence angles. The diffusion contribution to ER is particularly great near the desorption peak of the organic substance. Analytical expressions for the diffusion component of ER as a function of the incidence angle and potential drop modulation frequency have been obtained. The theoretical conclusions have been verified experimentally.

Original languageEnglish
Pages (from-to)1101-1106
Number of pages6
JournalElectrochimica Acta
Issue number8
StatePublished - Aug 1984
Externally publishedYes


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