Edge-type Josephson junctions in narrow thin-film strips

Maayan Moshe*, V. G. Kogan, R. G. Mints

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

We study the field dependence of the maximum current Im (H) in narrow edge-type thin-film Josephson junctions. We calculate Im (H) within nonlocal Josephson electrodynamics taking into account the stray fields. These fields affect the difference of phases of the order parameter across the junction and therefore the tunneling currents. We find that the phase difference along the junction is proportional to the applied field, depends on the junction geometry, but is independent of the Josephson critical current density, i.e., it is universal. An explicit formula for this universal function is derived and used to calculate Im (H). It is shown that the maxima of Im (H) 1/H and the zeros of Im (H) are equidistant only in high fields. We find that the spacing between the zeros is proportional to 1/ w2, where w is the width of the junction. The general approach is applied to calculate Im (H) for a superconducting quantum interference device (SQUID) with two narrow edge-type junctions.

Original languageEnglish
Article number020510
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume78
Issue number2
DOIs
StatePublished - 23 Jul 2008

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