Edge effects in pixelated CdZnTe gamma detectors

Asher Shor, Yossi Eisen, Israel Mardor

Research output: Contribution to journalConference articlepeer-review

Abstract

Edge effects in pixelated CdZnTe detectors are a result of the high dielectric constant of the CdZnTe detector material, and the tendency of the field lines emanating from the "hole" charge carriers to remain within the detector volume. As a result spectra for edge and corner pixels tend to exhibit a longer low energy tail at the expense of the number of events in the photo-peak. We focus on a thick pixelated CdZnTe detector, where, the detector thickness is comparable to the lateral size. We develop a theoretical Monte-Carlo simulation that well describes the experimentally observed edge effects. We show that when the same detector is embedded in an array of similar detector at the same HV, the edge effects disappear, and the spectral properties of even the central pixels improve noticeably.

Original languageEnglish
Article numberR4-1
Pages (from-to)3342-3345
Number of pages4
JournalIEEE Nuclear Science Symposium Conference Record
Volume5
StatePublished - 2003
Externally publishedYes
Event2003 IEEE Nuclear Science Symposium Conference Record - Nuclear Science Symposium, Medical Imaging Conference - Portland, OR, United States
Duration: 19 Oct 200325 Oct 2003

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