Dynamics of tip-substrate interactions in atomic force microscopy

Uzi Landman*, W. D. Luedtke, A. Nitzan

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

120 Scopus citations


Dynamical interactions between a scanning tip and a silicon substrate are investigated using molecular dynamics simulations of both the constant-height and constant-force scan modes. Localized temporary and permanent modifications of the substrate occur, depending on tip-substrate-strate separation and scan geometry. Implications for resolving structural and force characteristics in scanning tip spectroscopies, employing atomically sharp as well as large ordered of disordered tips are discussed.

Original languageEnglish
Pages (from-to)L177-L184
JournalSurface Science
Issue number3
StatePublished - 3 Mar 1989
Externally publishedYes


FundersFunder number
U.S. Department of EnergyFGO5-86ER45234


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