Dynamic crack surface instabilities initiated at dopants

Liron Ben-Bashat Bergman, Dov Sherman*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


The origin of micron-scale ridge-like fracture surface instabilities on the {1 1 1} low-energy cleavage plane of silicon crystal was elucidated by fracture experiments and surface analyses by scanning tunneling microscopy under ultra-high vacuum. These investigations show that when a low-speed crack collides with individual boron atoms along the crack front, atomic-height jogs are generated, gradually growing by pile-up mechanisms to over three orders of magnitude in height by forming ridges.

Original languageEnglish
Pages (from-to)14-17
Number of pages4
JournalScripta Materialia
StatePublished - 15 Mar 2014
Externally publishedYes


  • Brittle crystals
  • Crystallographic defects
  • Dynamic crack propagation
  • Surface instabilities


Dive into the research topics of 'Dynamic crack surface instabilities initiated at dopants'. Together they form a unique fingerprint.

Cite this