Dynamic crack surface instabilities initiated at dopants

Liron Ben-Bashat Bergman, Dov Sherman

Research output: Contribution to journalArticlepeer-review

Abstract

The origin of micron-scale ridge-like fracture surface instabilities on the {1 1 1} low-energy cleavage plane of silicon crystal was elucidated by fracture experiments and surface analyses by scanning tunneling microscopy under ultra-high vacuum. These investigations show that when a low-speed crack collides with individual boron atoms along the crack front, atomic-height jogs are generated, gradually growing by pile-up mechanisms to over three orders of magnitude in height by forming ridges.

Original languageEnglish
Pages (from-to)14-17
Number of pages4
JournalScripta Materialia
Volume75
DOIs
StatePublished - 15 Mar 2014
Externally publishedYes

Keywords

  • Brittle crystals
  • Crystallographic defects
  • Dynamic crack propagation
  • Surface instabilities

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