Disorder/order phase transition in C60 thin films studied by surface photovoltage spectroscopy

E. A. Katz; D. Faiman; B. Mishori; Yoram Shapira; A. Isakina; M. A. Strzhemechny

doi:10.1063/1.1625083

Disorder/order phase transition in C₆₀ thin films studied by surface photovoltage spectroscopy

E. A. Katz^*, D. Faiman, B. Mishori, Yoram Shapira, A. Isakina, M. A. Strzhemechny

^*Corresponding author for this work

Department of Electrical Engineering - Physical Eng.

Research output: Contribution to journal › Article › peer-review

9 Scopus citations

Abstract

The electronic properties of disorder/order phase transition in C ₆₀ thin films were studied using surface photovoltage (SPV) spectroscopy at 120-300 k. The thin films were deposited on a substrate of optical glass predeposited with a silver layer using vacuum deposition technique. The atomic force microscopy (AFM) was used to study the morphology of the front surface of the films. The results show that the energy position of the thresholds exhibited nonmonotonic behavior with a mirror symmetry.

Original language	English
Pages (from-to)	7173-7177
Number of pages	5
Journal	Journal of Applied Physics
Volume	94
Issue number	11
DOIs	https://doi.org/10.1063/1.1625083
State	Published - 1 Dec 2003

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abstract = "The electronic properties of disorder/order phase transition in C 60 thin films were studied using surface photovoltage (SPV) spectroscopy at 120-300 k. The thin films were deposited on a substrate of optical glass predeposited with a silver layer using vacuum deposition technique. The atomic force microscopy (AFM) was used to study the morphology of the front surface of the films. The results show that the energy position of the thresholds exhibited nonmonotonic behavior with a mirror symmetry.",

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AU - Isakina, A.

AU - Strzhemechny, M. A.

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AB - The electronic properties of disorder/order phase transition in C 60 thin films were studied using surface photovoltage (SPV) spectroscopy at 120-300 k. The thin films were deposited on a substrate of optical glass predeposited with a silver layer using vacuum deposition technique. The atomic force microscopy (AFM) was used to study the morphology of the front surface of the films. The results show that the energy position of the thresholds exhibited nonmonotonic behavior with a mirror symmetry.

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Disorder/order phase transition in C₆₀ thin films studied by surface photovoltage spectroscopy

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