Dislocations deflect and perturb dynamically propagating cracks

Dov Sherman*, Ilan Be'ery

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review


The fundamental phenomenon of crack deflection in single-crystal silicon when a dynamically propagating crack collides with stationary, intrinsic, and inclined screw dislocations, leading to high and long surface perturbations, was investigated. High resolution electron microscopy (HRSEM) and atomic force microscopy (AFM) were used to study the fracture surface. It was observed that an perturbation of height about 8 nm was form, when the crack collided with a single dislocation. while the crack collided with a group of adjacent dislocations, the perturbation extended up to 80 nm in height and 250 μm in length. It was also predicted that no interaction takes place, when a dislocation's line is perpendicular to the crack surface.

Original languageEnglish
Article number265501
JournalPhysical Review Letters
Issue number26 I
StatePublished - 31 Dec 2004
Externally publishedYes


Dive into the research topics of 'Dislocations deflect and perturb dynamically propagating cracks'. Together they form a unique fingerprint.

Cite this