Direct measurement of inhomogeneous longitudinal dopant distribution in SiNVVs using nano-probe scanning auger microscopy
- U. Givan*
- , J. K. Hyun
- , E. Koren
- , J. S. Hammond
- , D. F. Paul
- , L. J. Lauhon
- , Y. Rosenwaks
*Corresponding author for this work
- Tel Aviv University
- Northwestern University
- ULVAC, Inc.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
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