Dimensional crossover in the conductivity of coevaporated Pb-Ge films

M. L. Rappaport*, O. Entin-Wohlman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Scopus citations


The resistance of coevaporated Pb-Ge films was measured during their deposition onto room-temperature glass substrates. The dependence of the conductivity on thickness for several concentrations was analyzed according to the theory of interdimensional crossover in order to determine the percolation exponents t2 (in two dimensions) and t3 (in three dimensions) of the conductivity and 3 (in three dimensions) of the correlation length. This method has several advantages over the usual procedure of preparing samples of different concentration and constant thickness. It also measures film uniformity. The measured values of t2, t3, and 3 are consistent with accepted values.

Original languageEnglish
Pages (from-to)6152-6157
Number of pages6
JournalPhysical Review B-Condensed Matter
Issue number10
StatePublished - 1983


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