TY - GEN
T1 - DFT model errors for finite length observations with spatially distributed sensors
AU - Isbi, Yaniv
AU - Weiss, Anthony J.
PY - 2008
Y1 - 2008
N2 - The use of sensor systems, with multiple, spatially separated receivers, is ever growing. it is assumed that the propagation delays, from transmitter to receivers, are translated to phase expressions in the frequency domain. We investigate this property and demonstrate the addition of an edge effect. We use signal-to-interference ratio (SIR) notation to quantify this effect and analyze its influence. We demonstrate our work by estimating the influence of the edge effect on localization accuracy of Direct Position Determination (DPD) method using small error analysis, compared with Monte-Carlo simulations. To conclude our work we discuss some ways of mitigating the error hereby introduced.
AB - The use of sensor systems, with multiple, spatially separated receivers, is ever growing. it is assumed that the propagation delays, from transmitter to receivers, are translated to phase expressions in the frequency domain. We investigate this property and demonstrate the addition of an edge effect. We use signal-to-interference ratio (SIR) notation to quantify this effect and analyze its influence. We demonstrate our work by estimating the influence of the edge effect on localization accuracy of Direct Position Determination (DPD) method using small error analysis, compared with Monte-Carlo simulations. To conclude our work we discuss some ways of mitigating the error hereby introduced.
KW - Direct Position Determination (DPD)
KW - Discrete fourier transform (DFT)
UR - http://www.scopus.com/inward/record.url?scp=62749159386&partnerID=8YFLogxK
U2 - 10.1109/EEEI.2008.4736661
DO - 10.1109/EEEI.2008.4736661
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AN - SCOPUS:62749159386
SN - 9781424424825
T3 - IEEE Convention of Electrical and Electronics Engineers in Israel, Proceedings
SP - 80
EP - 84
BT - 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2008
T2 - 2008 IEEE 25th Convention of Electrical and Electronics Engineers in Israel, IEEEI 2008
Y2 - 3 December 2008 through 5 December 2008
ER -